主要特點和優點
<0.7 pF 總電容負荷，限度地降低對電路的插入性
20 k? 輸入電阻
6.5 Vp-p動態范圍，支持多種邏輯家族
通用探頭，靈活地連到行業標準連接上
無連接器探測系統，不需要機載連接器
應用
硬件調試和檢驗
處理器/ 總線調試和檢驗
嵌入式軟件集成、調試和檢驗
為實時數字系統分析提供的探測解決方案
P6400 系列探頭
如果沒有探測，不考慮探頭對系統及測量時間的影響，那么測試測量解決方案是不完整的。由于業內的探頭負荷，P6400系列邏輯分析儀探頭保護了信號完整性，限度地降低了其對電路的影響。在與TLA5000系列邏輯分析儀結合使用時，P6400系列邏輯分析儀探頭以經濟的價格提供了完善的邏輯分析功能。有多種連接機制可供選擇，包括不需要機載連接器的高密度D-Max® 探測技術。
對電路板空間有限的應用，高密度P6450提供了最小的體積及快速連接機制。
由于負荷電容低，P6400系列可以以更快的邊沿速率準確地采集信號，而不會使信號失真。
靈活的通用探頭支持0.100 英寸和2 毫米針腳間隔、低輸入電容和附件，可以連到許多行業標準連接上。
P6800 和P6900 系列探頭
P6700 系列探頭為驗證工程師提供了一套完善的PCI Express探測解決方案，包括中間總線、插槽內插器和焊接式連接器。通過使用兩個連接器支持長達24英寸的PCI Express Gen3信道，這些探頭提供了最小的負荷及的信號保真度和有源均衡技術，確保準確地恢復閉上的眼圖數據。所有P6700系列都有圖形通路混配功能，提供了靈活性，可以適應各種的電路板布線。
Main features and advantages
< 0.7pf total capacitive load to minimize circuit insertion
20 k ? input resistance
Vp-p dynamic range, supporting multiple logic families
Universal probe, flexibly connected to industry standard connection
No connector detection system, no need for onboard connectors
application
Hardware debugging and validation
Processor/bus debugging and validation
Embedded software integration, debugging and validation
Provides leading detection solutions for real-time digital system analysis
P6400 series probes
The test and measurement solution is incomplete without probes, regardless of the probe's impact on the system and measurement time. Due to the industry's lowest probe load, the P6400 series logic analyzer probes protect signal integrity and minimize its impact on the circuit. When used in combination with the TLA5000 series logic analyzer, the P6400 series logic analyzer probes provide complete logic analysis functions at an economical price. There are several connection mechanism to choose from, including high density D - don't need a connector is installed on the Max ® detection technology.
For applications where PCB space is limited, the high density P6450 provides minimum volume and fast connection mechanism.
Because of the low load capacitance, the P6400 series can capture signals accurately at a faster edge rate without distortion.
Flexible universal probe supports 0.100 "ａnd 2 mm pin spacing, low input capacitance and accessories, and can be connected to many industry standard connections.
P6800 and P6900 series probes
The P6700 series probes provide validation engineers with a complete PCI Express probe solution that includes an intermediate bus, a slot interpolator, and a soldered connector. By using two connectors to support the 24-inch PCI Express Gen3 channel, these probes provide minimal load and the highest signal fidelity and active equalization technology to ensure accurate recovery of closed eye chart data. All P6700 series have a graphics path mix function, providing maximum flexibility to accommodate a variety of unique circuit board wiring.
